Edited by Michael R. Lyu. Published by IEEE Computer Society Press and McGraw-Hill Book Company
Chapter 9. Orthogonal Defect Classification
Ram Chillarege Excript from the table of contents
9.1 Introduction
359 9.2 Measurement and Software 360 9.2.1 Software Defects 361 9.2.2 The Spectrum of Defect Analysis 364 9.3 Principles of ODC 367 9.3.1 The Intuition 367 9.3.2 The Design of Orthogonal Defect Classification 370 9.3.3 Necessary Condition 371 9.3.4 Sufficient Conditions 373 9.4 The Defect-Type Attribute 374 9.5 Relative Risk Assessment Using Defect Types 376 9.5.1 Subjective Aspects of Growth Curves 377 9.5.2 Combining ODC and Growth Modeling 379 9.6 The Defect Trigger Attribute 384 9.6.1 The Trigger Concept 384 9.6.2 System Test Triggers 387 9.6.3 Review and Inspection Triggers 387 9.6.4 Function Test Triggers 388 9.6.5 The Use of Triggers 389 9.7 Multidimensional Analysis 393 9.8 Deploying ODC 396 9.9 Summary 398 Problems 399