IBM Outstanding Innovation Award

IBM presents to
Ram Chillarege
An Outstanding Innovation Award
in appreciation for:
Orthogonal Defect Classification
August 1993

News

Title
IEEE Computer Society Technical Achievement Award
Fast Abstracts - the idea and the origin.
BSPIN - Photo Naming
Orthogonal Defect Classification: An Agile Test/QA Primer
Tutorial at ISSRE, Pasadena CA
ODC Tutorial at IEEE International Symposium on Software Reliability Engineering 2013, Pasadena CA
Ram Chillarege
News
TISQA Ralegh, NC
IBM Outstanding Innovation Award
The Chandrapal Project
Fast Abstracts - Launching the idea

Title
Visualising the unobservable - NIST, Washington DC
Optimized Software Engineering, Hiroshima, Japan
Tutorial at ISSRE, Pasadena CA
ODC Tutorial at IEEE International Symposium on Software Reliability Engineering 2013, Pasadena CA
Talks
IEEE Fellow Talk - IIIT Bangalore
Computer Science Colloquium, University of Texas, Dallas
IPA SEC Special Seminar: Software Dependability, Tokyo, Japan
Bohr-Mandel Bugs - contrast data with NASA study, Pasadena, CA
Orthogonal Defect Classification: An Agile Test/QA Primer
TISQA Ralegh, NC
BSPIN Talk on ODC - Bangalore, India