IEEE Fellow Talk : ODC Analytics for Competitive Software Process Management
Talk by IEEE Fellow Dr. Ram Chillarege, on "ODC Analytics for Competitive Software Process Management", organized by the IEEE Computer Society - Bangalore Chapter at IIIT-Bangalore on March 2nd 2011 from 4:00 PM - 5:30 PM.
This is an open to all talk and no charges to attend. Please forward this email to others who may be interested. If you plan to attend this talk, please register using the link. In case of problems, please send an e-mail to ieeecsblr@gmail.com.
Speaker: Dr. Ram Chillarege of Chillarege Inc.
Topic: ODC Analytics for Competitive Software Process Management
Orthogonal Defect Classification (ODC) is a measurement system for Software Engineering. ODC extracts specific semantics from the change control logs to turn them into a powerful measurement system on the software development process. Analytics used on these data create insight and visualization for the engineering team, akin to medical imaging methods for doctors. This yields insightful process diagnosis and better development strategies. ODC is a deep area and over the years has seen publications from several noted organizations such as: Caterpillar, Cisco, IBM, Motorola, NASA, Telcordia, etc.
This talk will: - Provide an overview of ODC - Illustrate applications using case studies - Position ODC relative to CMMI, Six Sigma, Static Analysis, Inspections, Testing, Agile, etc. - Address the intersection of software engineering and business/economic issues - Identify a few implimentation issues
Biography: Ram, is the inventor of Orthogonal Defect Classification (ODC), which brought a new order of insight into measuring and managing software engineering. He was with IBM for 14 years where he founded and headed the IBM Center for Software Engineering. He then served as Executive Vice President of Software and Technology for Opus360, New York. He received the IBM Outstanding Innovation Award for ODC in 1993. In 1995 Ram led the IBM Academy study on Software Testing culminating in forming IBM's company wide Software Test initiative. In 2004 Ram received the IEEE technical achievement award for the invention of Orthogonal Defect Classification (ODC). Ram is an IEEE Fellow, and author of ~50 peer reviewed technical articles. He chairs the IEEE Steering Committee for the International Symposium on Software Reliability Engineering. He received a BSc degree from the University of Mysore, BE and ME from the Indian Institute of Science, and PhD from the University of Illinois, Urbana Champaign in Electrical and Computer and Engineering.
Talk by IEEE Fellow Dr. Ram Chillarege, on "ODC Analytics for Competitive Software Process Management", organized by the IEEE Computer Society - Bangalore Chapter at IIIT-Bangalore on March 2nd 2011 from 4:00 PM - 5:30 PM. This is an open to all talk and no charges to attend. Please forward this email to others who may be interested. If you plan to attend this talk, please register using the link. In case of problems, please send an e-mail to ieeecsblr@gmail.com.
Meeting Agenda:
4:00 - 4:05 - Introduction
4:05 - 5:05 - Expert Talk by Dr. Ram Chillarege (One Hour)
5:05 - 5:15 - Q & A
5:15 - 5:30 - Networking